ICAN Nanoanalytics Workshop

Detailed insights into the world of atoms, molecules and nanostructures: On 17 and 18 November 2016, the Interdisciplinary Center for Analytics on the Nanoscale (ICAN) of the University Duisburg-Essen (UDE) is organising the Nanoanalytics Workshop "Techniques, Methods and Applications" at the Campus Duisburg. Interested members from industry and research as well as students and young scientists are invited to participate in this event. The workshop is complemented with a guided tour through the DFG-Gerätezentrum ICAN with demonstrations as well as consultations on individual questions.

 

 

The following methods are in the focus of the practical lectures:

  • X-ray photoelectron spectroscopy (XPS)
  • Scanning Auger electron microscopy (SAM)
  • Atomic force and scanning probe microscopy (AFM/SPM)
  • Transmission and scanning transmission electron microscopy (TEM/STEM), incl. EELS/EDX
  • Time-of-flight secondary ion mass spectrometry (TOF-SIMS)

 

Further information on the event can be found in the program flyer (PDF, 780 KB) or online via https://www.uni-due.de/cenide/ican/workshop-programm.php

 

WHEN: 17. – 18. November 2016

WHERE: NanoEnergieTechnikZentrum (NETZ). University Duisburg-Essen, Carl-Benz-Straße 199, 47057 Duisburg, Germany

 

Participation & Registration: The participation fee for the workshop is € 80, for members of a university or € 40 and is free of charge for UDE employees. Included in the participation fee is the full-day visit, including guided tour of the microscopy center, breaks, lunch and meeting materials.
Registration is open until 11. November 2016 via the online form (https://www.uni-due.de/cenide/ican/workshop.php).

 

Contact

  • Prof. Dr. Nils Hartmann, Tel: +49 203 379-8033, This email address is being protected from spambots. You need JavaScript enabled to view it.
  • Marcel Wienand, Tel: +49 203 379–8038, This email address is being protected from spambots. You need JavaScript enabled to view it.

 

 

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