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INM – Leibniz Institute for New Materials has joined forces with a manufacturer of analytical equipment to reduce particles losses and avoid false negatives.

 

Many everyday products and our environment contain nanoparticles, and there is increasing interest in finding them. The particles and their sizes are commonly detected using specialized analytical techniques. If nanoparticles are lost in the analytical apparatus, they are not detected, and a "false negative" result occurs. The INM – Leibniz Institute for New Materials has joined forces with a manufacturer of analytical equipment to reduce particles losses and avoid false negatives. They developed reference nanoparticles and used them to investigate how the analysis can be improved.

 

In project DINAFF, researchers at INM and Superon GmbH managed to reduce the loss of nanoparticles during analysis and, therefore, to improve the limit of detection. The researchers modified the inner surface of the analytical apparatus, optimized measurement parameters such as flow speed, and tuned the surface properties of the target nanoparticles.

"We worked with so-called tracer particles for our analyses," Tobias Kraus from INM explained. "These are nanoparticles that we deliberately add to each sample. We therefore know that we should be able to find these particles in the sample. If we do not find them, something during the analysis impedes detection and causes a false negative." Parameters of the analytical method then have to be adjusted so that the tracer particles become detectable.......

 

  • Read the complete press release (www.leibniz-inm.de/en, 23. March 2016) via http://www.leibniz-inm.de/en/2016/03/optimized-analytics-reduce-false-negatives-in-the-detection-of-nanoparticles/

 

 

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