IMT Seminar  2016

On November 17th 2016, the Institute of Microstructure Technology (IMT) from the KIT is hosting a seminar on "Surface analysis Using Scanning Probes and Related Techniques". Everyone interested is invited to attend the seminar, which is free of charge.

 

  • For further information and registration please visit the IMT website http://www.imt.kit.edu/afm-course.php

 

WHEN: 17. November 2016, 09:30 – 17:00

WHERE: Seminar room (Rm 405) of the Institute of Microstructure Technology (IMT), Campus North KIT, 76344 Eggenstein-Leopoldshafen, Germany

Contact & Registration: Richard Thelen, Tel.: +49 721 608-22727, This email address is being protected from spambots. You need JavaScript enabled to view it.

 

Programme

  • 09:30 Basic Principles of Atomic Force Microscopy (Stefan Walheim, INT)
  • 10:30 Coffee break
  • 11:00 Atomic Force Microscopy in Ultra-high Vacuum and X-ray scattering as complementary methods (Bärbel Krause, IPS)
  • 12:00 Lunch break
  • 13:00 Nanoindentation (Ruth Schwaiger, IAM)
  • 13:45 From the Basics of XPS and ToF-SIMS to Applications in Materials (Michael Bruns, IAM)
  • 14:30 Coffee break
  • 15:00 Combining Equipment for Sophisticated Metrology Tasks (Richard Thelen, IMT)
  • 15:45 Dip-Pen Nanolithography (Michael Hirtz, INT)
  • 16:30 End of course

 

 

 

 

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